Mattea Mačkić Jovanović stayed at the Instituto de Nanociencia y Materiales de Aragón and the Laboratorio de Microscopías Avanzadas from May 24 to June 19, 2026, as a visiting researcher for the purpose of professional training in X-ray diffraction (XRD), atomic force microscopy (AFM), sample preparation using a FIB/SEM system (TEM lamella fabrication), and transmission electron microscopy (TEM).
During her stay, she acquired new theoretical knowledge and practical experience related to the aforementioned experimental techniques. Her research activities included the characterization of SnO₂ thin-film samples synthesized by atomic layer deposition (ALD) at the Faculty of Physics, University of Rijeka, using the above-mentioned analytical methods.
This research mobility provided an opportunity to expand her scientific competencies, gain experience with new experimental approaches, and strengthen international research collaboration. The knowledge and skills acquired during the training will make a significant contribution to her future scientific research activities, the preparation of her doctoral dissertation, and her professional development.
