Ivna Kavre Piltaver participated in the workshop Advancing Imaging & Analysis in Battery Materials and Semiconductor Research, held on 11–12 March 2026 in Wiesbaden, Germany, and organized by Oxford Instruments.
The workshop focused on advanced characterization techniques used in research on battery materials and semiconductors. The programme included expert presentations and live system demonstrations showcasing modern analytical approaches for materials characterization.
During the workshop, participants were introduced to the capabilities of electron microscopy combined with X-ray analysis, atomic force microscopy (AFM), Raman imaging and spectroscopy, as well as NMR spectroscopy. These techniques were presented in the context of their application in studying the structure, composition, and morphology of materials relevant to the development of advanced battery systems and semiconductor technologies.
Participation in the workshop provided valuable insights into state-of-the-art analytical methods and offered opportunities for knowledge exchange with researchers and experts in the field of materials science.
